Browsing by Subject IGZO; TFT; bias stress; optical stress; defects; SILVACO simulation
Showing results 1 to 1 of 1
Issue Date | Title | Author(s) |
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3-Mar-2016 | Numerical simulation of bias and photo stress on indium-gallium-zinc-oxide thin film transistors | M. Adaika; Af Meftah; N. Sengouga; M. Henini |