Browsing by Subject Keywords: IGZO; TFT; bias stress; optical stress; defects; SILVACO simulation
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 27-Feb-2016 | Numerical simulation of bias and photo stress on indium-gallium-zinc-oxide thin film transistors | M. Adaika; Af Meftah; N. Sengouga; M. Henini |