Browsing by Subject Charge coupled devices, position sensitive detectors, radiation damage, semiconductor detectors: characterization, silicon.
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
| 19-May-2013 | Comparison of Measurements of Charge Transfer Inefficiencies in a CCD with High-Speed Column Parallel Readout | André Sopczak, Khaled Bekhouche, Chris Bowdery, Chris Damerell, Gavin Davies, Lakhdar Dehimi, Tim Greenshaw, Michal Koziel, Konstantin Stefanov, James Walder, Tim Woolliscroft, and Steve Worm |
